发明名称 METHOD OF PRECOATING PLASMA ENHANCED CVD SYSTEM
摘要 PROBLEM TO BE SOLVED: To reduce the occurrence of foreign substance in a film deposition process in a plasma enhanced CVD system using microwave and radio frequency(RF) plasma and to attain a plasma enhanced CVD system having high working ratio. SOLUTION: After the completion of NF3 plasma cleaning, microwave is introduced into a reaction chamber 1 and RF is applied to an upper chamber 2 to precoat the internal wall surface of the reaction chamber 1 with an SiO2 film of desired thickness. Owing to the confinement of molecules adsorbed on the wall surface immediately after plasma cleaning and the smoothing of the wall surface, the increase of foreign substance due to peeled-off layer at film deposition and the occurrence of foreign substance by abnormal electric discharge at the internal wall surface of the reaction chamber 1 at film deposition can be prevented.
申请公布号 JP2001123271(A) 申请公布日期 2001.05.08
申请号 JP19990302018 申请日期 1999.10.25
申请人 HITACHI LTD 发明人 HOSHINO MASAKAZU;MIYA TAKESHI;HACHITANI MASAYUKI;OYAMA KATSUMI
分类号 H01L21/205;C23C16/44;C23C16/511;(IPC1-7):C23C16/44 主分类号 H01L21/205
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