发明名称 Semiconductor-oxide-semiconductor capacitor formed in integrated circuit
摘要 An integrated capacitor structure includes first and second, conductive semiconductor portions spaced apart from one another where the first and second semiconductor portion are both of a same conductivity type (both N or both P). The integrated capacitor structure may be formed using same processes as are used for fabricating gate insulator and gate electrode parts of neighboring MOS transistors in a same integrated circuit.
申请公布号 US6228696(B1) 申请公布日期 2001.05.08
申请号 US19980187691 申请日期 1998.11.05
申请人 VANTIS CORPORATION 发明人 NGUYEN BAI;SHARPE-GEISLER BRADLEY A.
分类号 H01L27/06;H01L29/94;(IPC1-7):H01L21/823 主分类号 H01L27/06
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