Method and apparatus for burn-in and test of field emission displays

摘要

A method and apparatus which provides for continual monitoring of the electrical and optical performance of one or more field emission display devices while the devices are burned-in is for the purpose of proper aging and testing of screen phosphors and semiconductor circuitry as well as determining the failure of the display devices including failures of individual field emitters within a display device. Display performance parameters including luminance anode current and field emitter performance are measured for determining when the components are properly aged as well as determining catastrophic failures in a display or a substantial degrade in performance in order to determine when and how the device may have failed.