Method of manufacturing semiconductor device

摘要

A plurality of CVD silicon nitride film islands are formed on a lower electrode which is located over a semiconductor substrate. The plurality of CVD silicon nitride film islands are spaced apart from one another to define exposed regions of the lower electrode therebetween. The CVD silicon nitride film islands and the exposed regions of the lower electrode are then subjected to heat treatment in a nitride atmosphere to form thermal silicon nitride films in the exposed regions of the lower electrode. A capacitor insulating film is formed over the CVD silicon nitride film islands and the thermal silicon nitride films, and then an upper electrode is formed over the capacitor insulating film.