发明名称 Ion implantation with programmable energy, angle, and beam current
摘要 A method and apparatus for performing multiple implantations in a semiconductor wafer is used to set variable implantation waveforms. An implanter is used, which allows for setting of variable waveforms, corresponding to energy, beam current, and angle, used for implantation. At least one of a ramping voltage, a ramping beam current source, and a programmable motor mechanically connected to a wafer table is used to obtain the variable waveforms. Using the implanter and method of the invention, detailed doping profiles are created using only a single implant. Such detailed doping profiles are used to create high gradient retrograde wells, and transistors with punch-through suppression implants and channel implants with controlled dopant gradients.
申请公布号 US6229148(B1) 申请公布日期 2001.05.08
申请号 US19970909345 申请日期 1997.08.11
申请人 MICRON TECHNOLOGY, INC. 发明人 PRALL KIRK;REINBERG ALAN R.
分类号 H01J37/317;H01L21/265;H01L21/8242;H01L29/10;H01L29/36;(IPC1-7):H01J37/317;H01J37/702 主分类号 H01J37/317
代理机构 代理人
主权项
地址