发明名称 Fine movement mechanism unit and scanning probe microscope
摘要 A fine movement mechanism unit is configured by a supporting member, two fixed sections fixed to this supporting member, two pairs of parallel-plate flexural sections disposed between the two fixed sections, an X fine movement mechanism, a Y fine movement mechanism, and a Z fine movement mechanism. The X fine movement mechanism has an X moving section movable in an X direction, connected to each of the two fixed sections through the two pairs of parallel-plate flexural sections, and two X direction piezoelectric actuators causing the X moving section to move. The Y fine movement mechanism arranged to the X moving section, has other two pairs of parallel-plate flexural sections, a Y moving section movable in the Y direction, connected to the X moving section through the other two pairs of parallel-plate flexural sections, and two Y direction piezoelectric actuators causing the Y moving section to move relatively to the X moving section. The Z fine movement mechanism arranged to the Y moving section, has a Z moving section movable in a Z direction perpendicular to both of the X and Y directions, and a Z direction piezoelectric actuator causing the Z moving section to move.
申请公布号 US6229607(B1) 申请公布日期 2001.05.08
申请号 US19980182048 申请日期 1998.10.29
申请人 HITACHI CONSTRUCTION MACHINERY CO., LTD. 发明人 SHIRAI TAKASHI;MURAYAMA KEN;MORIMOTO TAKAFUMI;KURODA HIROSHI;ONOZATO HARUMASA
分类号 G01B21/30;G01B5/28;G01B7/34;G01B11/14;G01N23/00;G01N27/00;G01N37/00;G01Q10/00;G01Q10/04;G01Q90/00;G05D3/00;(IPC1-7):G01B11/14 主分类号 G01B21/30
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