发明名称 METHOD FOR MEASURING DELAY TIME DUE TO WIRE CONNECTING PART
摘要 PURPOSE: A method for measuring delay time due to a wire connecting part is provided to evaluate the influence of a via upon delay time quantitatively and exactly. CONSTITUTION: A method for measuring delay time due to a wire connecting part includes following steps. A load area is formed by locating a signal line pattern which is composed of the first lower wire and the first upper wire and a reference line pattern which is composed of the second lower wire and the second lower wire on a substrate alternatively and insulating them each other. The first via connects the first lower wire with the first upper wire electrically. The second via connects the second lower wire with the second upper wire electrically. A predetermined voltage is applied to the reference line pattern. An oscillator is coupled to both terminals of the signal line pattern to measure signal delay.
申请公布号 KR20010035660(A) 申请公布日期 2001.05.07
申请号 KR19990042351 申请日期 1999.10.01
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 LEE, HUI DEOK
分类号 G01R27/00;(IPC1-7):G01R27/00 主分类号 G01R27/00
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