发明名称 SEMICONDUCTOR DEVICE HAVING PARTIAL SILICON-ON-INSULATOR STRUCTURE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device having a partial silicon-on-insulator(SOI) structure is to provide the same body contact as a conventional semiconductor device without a design modification, by forming a porous silicon layer or silicon layer under an upper silicon layer to become a path in which the porous silicon layer or the silicon layer partially contact a lower silicon substrate. CONSTITUTION: An upper silicon pattern(25a) is electrically separated from a lower silicon substrate(21) by a separation insulating layer(33a) buried in a reverse T-type hole formed in the lower silicon substrate. A gate insulating layer(38) and a gate electrode(39) are formed on the upper silicon pattern. A source/drain region(36,37) and a channel region between the source and the drain are formed in the upper silicon pattern under both sidewalls of the gate electrode. A silicon layer is formed under the channel region to electrically contact the lower silicon substrate and the silicon pattern.
申请公布号 KR20010036815(A) 申请公布日期 2001.05.07
申请号 KR19990043988 申请日期 1999.10.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAE, GEUM JONG
分类号 H01L21/76;H01L21/34;H01L21/762;H01L21/764;H01L27/08;H01L27/12;H01L29/78;H01L29/786;(IPC1-7):H01L21/34 主分类号 H01L21/76
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