发明名称 |
SEMICONDUCTOR DEVICE HAVING PARTIAL SILICON-ON-INSULATOR STRUCTURE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device having a partial silicon-on-insulator(SOI) structure is to provide the same body contact as a conventional semiconductor device without a design modification, by forming a porous silicon layer or silicon layer under an upper silicon layer to become a path in which the porous silicon layer or the silicon layer partially contact a lower silicon substrate. CONSTITUTION: An upper silicon pattern(25a) is electrically separated from a lower silicon substrate(21) by a separation insulating layer(33a) buried in a reverse T-type hole formed in the lower silicon substrate. A gate insulating layer(38) and a gate electrode(39) are formed on the upper silicon pattern. A source/drain region(36,37) and a channel region between the source and the drain are formed in the upper silicon pattern under both sidewalls of the gate electrode. A silicon layer is formed under the channel region to electrically contact the lower silicon substrate and the silicon pattern.
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申请公布号 |
KR20010036815(A) |
申请公布日期 |
2001.05.07 |
申请号 |
KR19990043988 |
申请日期 |
1999.10.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BAE, GEUM JONG |
分类号 |
H01L21/76;H01L21/34;H01L21/762;H01L21/764;H01L27/08;H01L27/12;H01L29/78;H01L29/786;(IPC1-7):H01L21/34 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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