发明名称 METHOD FOR MEASURING SENSIBILITY IDLE DEGREE OF MICROPROCESSOR
摘要 PURPOSE: A method for measuring a sensibility idle degree of a microprocessor is provided to supply sensitive judgement standards to system operators by enabling the system operators to judge an idle degree of a global central processing unit and recognize a change of an idle degree of a local central processing unit. CONSTITUTION: The substitution of Ipre< -Icur, Dpre< -Dcur is performed(S1). After the Icur is determined, a ratio of F< -T x Dpre + (2N-T) x Icur/2N is estimated. The ratio is substituted for F(S2). It is judged whether the Icur is identical to the Ipre. In case that the Icur isn't identical to the Ipre, a ratio of (F-Dpre)/(Icur-Ipre) is estimated. The ratio is substituted for a coefficient of C(S3). In case that the Icur is identical to the Ipre, the F is substituted for Dcur(S4). It is judged whether the C is larger than 0(S5). In case that the C isn't larger than 0, the C is substituted for Dcur< -Dpre(S6). The Dcur is outputted to a screen(S7). It is judged whether the Icur is identical to the Ipre. In case that the Icur is identical to the Ipre, the fact that the Dcur isn't changed is outputted(S8). In case that the Icur isn't identical to the Ipre, a process is terminated(S9).
申请公布号 KR100295956(B1) 申请公布日期 2001.05.04
申请号 KR19960016793 申请日期 1996.05.18
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOON, JI HUN
分类号 G06F11/30;(IPC1-7):G06F11/30 主分类号 G06F11/30
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