发明名称 Deep-diffused n-conducting region production in p-doped silicon substrate comprises ion implanting sulfur or selenium as n-foreign material into regions and subsequently heat treating
摘要 Production of deep-diffused n-conducting regions (8, 9) in a p-doped silicon substrate (1) comprises ion implanting sulfur or selenium as n-foreign material into the regions and subsequently heat treating. Preferred Features: The silicon substrate is a silicon wafer into which the regions are inserted on both sides so that they overlap in half the wafer depth. Ion implantation is masked using a silicon dioxide or photo-lacquer layer (2, 3).
申请公布号 DE19948906(A1) 申请公布日期 2001.05.03
申请号 DE19991048906 申请日期 1999.10.11
申请人 INFINEON TECHNOLOGIES AG 发明人 SCHULZE, HANS-JOACHIM
分类号 H01L21/265;H01L29/06;H01L29/167;(IPC1-7):H01L21/266 主分类号 H01L21/265
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