发明名称 High-vacuum packaged microgyroscope and method for manufacturing the same
摘要 <p>A high-vacuum packaged microgyroscope for detecting the inertial angular velocity of an object and a method for manufacturing the same. In the high-vacuum packaged microgyroscope, a substrate with an ASIC circuit for signal processing is mounted onto another substrate including a suspension structure of a microgyroscope in the form of a flip chip. Also, the electrodes of the suspension structure and the ASIC circuit can be exposed to the outside through polysilicon interconnection interposed between double passivation layers. The short interconnection between the suspension structure and the ASIC circuit can reduce the device in size and prevents generation of noise, thereby increasing signal detection sensitivity. In addition, by sealing the two substrates at low temperatures, for example, at 363 to 400 DEG C using co-melting reaction between metal, for example, Au, and Si in a vacuum, the degree of vacuum in the device increases. <IMAGE></p>
申请公布号 EP1096259(A1) 申请公布日期 2001.05.02
申请号 EP20000122364 申请日期 2000.10.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, SEOK-JIN;KO, YOUN-IL;KIM, HO-SUK
分类号 B81B3/00;B81B7/00;G01C19/56;G01P1/02;G01P15/08;H01L29/84;(IPC1-7):G01P15/08;B81C3/00;B81B7/02 主分类号 B81B3/00
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