发明名称 |
Method and apparatus for built-in self-test of smart memories |
摘要 |
A self-testing smart memory (28) is provided in which memory test circuitry (46) within the smart memory (28) writes a pattern to a data RAM (32) and a broadcast RAM (34) and then reads the data RAM (32) and the broadcast RAM (34) to determine if any failures exist within the memory locations. Furthermore, a data path tester (50) determines the functionality of a data path (30) within smart memory (28).
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申请公布号 |
US6226766(B1) |
申请公布日期 |
2001.05.01 |
申请号 |
US19940224407 |
申请日期 |
1994.04.07 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
HARWARD MARK G. |
分类号 |
G06F12/16;G11C29/00;G11C29/12;G11C29/36;(IPC1-7):G11C29/00 |
主分类号 |
G06F12/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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