| 摘要 |
In an IC tester comprising a tester part and a handler which includes two test stations or an IC tester comprising a tester part and two handlers, useless waiting times wasted by the tester part are eliminated. Means (SO) is provided for inputting a simultaneous measurement mode into the handler 2, and when the simultaneous measurement mode is inputted, the handler waits, in case the test preparation in the first test station 15a is completed and the test preparation in the second test station 15b is not completed, till the test preparation in the second station is completed, and when the test preparation in the second station is completed, the handler transmits the test preparation complete signals of both the stations to the tester part 1. The handler waits, in case the test preparation in the second station is completed and the test preparation in the first station is not completed, till the test preparation in the first station is completed, and when the test preparation in the first station is completed, the handler transmits the test preparation complete signals of both the stations to the tester part.
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