Method for electrical shunt detection and removal on semiconductors

摘要

An improved method of detecting and removing a shunt from a photoelectric semiconductor device comprises the steps of characterizing the device by generated data or performance graph; forward biasing the device; producing electromagnetic radiation from the device; receiving the radiation; associating a contrast in radiation to the defect; and mechanically removing the defect, whereby the defect is removed in the absence of a step of applying a chemical to the defect to assist in removing the defect.