发明名称 Method of fabricating a thin-film resistor having stable resistance
摘要 The present invention provides a method of forming a thin-film resistor with a stable electric resistance on a dielectric layer of a semiconductor wafer. The method involves: 1. forming a resistance layer and a protective layer in a predetermined area of the dielectric layer, the protective layer being positioned on the resistance layer, 2. forming an insulating layer on the upper and side surfaces of the protective layer and the side surface of the resistance layer in the predetermined area, and on the surface of the dielectric layer outside the predetermined area, 3. performing a dry-etching process on the insulating layer within the predetermined area to form two openings extending down to the protective layer, the protective layer being used for preventing the resistance layer from plasma damage caused by the dry-etching process, 4. performing a wet-etching process on the protective layer through the two openings of the insulating layer to form two openings extending down to the resistance layer, 5. forming two plugs in the two openings of the insulating layer and the protective layer for electrically connecting two ends of the resistance layer, and 6. forming two conductive layers on the two plugs as two electric wires for electrically connecting the two ends of the resistance layer.
申请公布号 US6225183(B1) 申请公布日期 2001.05.01
申请号 US19990330030 申请日期 1999.06.11
申请人 UNITED MICROELECTRONICS CORP. 发明人 LEE JIA-SHENG
分类号 H01L21/02;H01L27/08;(IPC1-7):H01L21/20 主分类号 H01L21/02
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