| 摘要 |
In an automatic chip test machine for testing electronic components, a novel quick disconnect articulated chuck for securing a chip nest, allowing rapid changes of the chuck and plunger head with minimum production downtime. The preferred embodiment of the chuck is comprised of a chuck base and a quick disconnect assembly. The quick disconnect assembly includes a vacuum seal, a retractable piston with vacuum cup attachment for securing a chip, a plunger head, alignment pins, and accessible disconnect screws. The base housing is mounted in a manner that permits articulation of the chuck to allow the chuck to align with the electrical test fixture; and a vacuum introduction port. In an alternate embodiment, a roller ball and detent mechanism is employed to permit relatively low forces of the initial mating action between the chuck and the fixture to move the chuck into a position of better alignment, and therefore lower stress and wear. In alternative embodiments, the chuck may be a single piece improved parallel articulating chuck, or a simplified one-piece quick disconnect chuck.
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