发明名称 Ozone-processing apparatus for semiconductor process system
摘要 An ozone-processing apparatus for a semiconductor process system includes an airtight process chamber and a lamp chamber, which are partitioned by a window for transmitting ultraviolet rays. A plurality of ultraviolet-ray lamps is arrayed along the window in the lamp chamber. A measurement space is defined between the window and the lamps in the lamp chamber. The lamp chamber is provided with a mount portion to set up a measuring unit therein. The measuring unit includes a sensor to be inserted into the measuring space, for measuring the light quantity of the lamps. The sensor is movable in a direction in which the lamps are arrayed.
申请公布号 US6224934(B1) 申请公布日期 2001.05.01
申请号 US20000587571 申请日期 2000.06.06
申请人 TOKYO ELECTRON LIMITED 发明人 HASEI MASAAKI;ISHIKAWA KENJI;SHOU QIAN SHAO;NAKANO TETSUYA
分类号 H01L21/31;C01B13/10;C30B33/00;H01L21/00;(IPC1-7):C23C16/00 主分类号 H01L21/31
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