发明名称 |
APPARATUS FOR ANALYZING CUTS |
摘要 |
A system for analyzing the quality of the sawing of a material which includes a scanning unit, a cut parameter identifier and a cut analyzer. The scanning unit scans along cuts of the material and views at least a portion of a cut. The cut parameter identifier identifies and stores parameters of the viewed cut portion. The cut analyzer analyzes the parameters of a multiplicity of viewed cut portions and which determines the quality of the cuts therefrom. |
申请公布号 |
IL120656(A) |
申请公布日期 |
2001.04.30 |
申请号 |
IL19970120656 |
申请日期 |
1997.04.13 |
申请人 |
INSPECTECH LTD. |
发明人 |
MICHAEL GEFFEN;ABRAHAM BEN-HAR |
分类号 |
G01N21/88;G01N21/956;G06F19/00;G06T7/00;H01L;H01L21/302;H01L21/66;H01L21/78;(IPC1-7):H01L21/302 |
主分类号 |
G01N21/88 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|