发明名称 Random access memory apparatus for a waveform measuring apparatus
摘要 A waveform measuring and display instrument includes a random access data memory bank consisting of four similar data memory parts, which can be configured or organized as one single memory section, two individual half sections, or four individual sections. Each part has an input port coupled by a multiplexer to any one of a plurality of waveform data acquisition plug-in units. During data acquisition, a controller includes a direction memory which sets the multiplexer to establish a connection of the signal inputs to the memory parts. The direction memory is written by the processor in accordance with the setting of a user operated control means for selection of the memory configuration. A CRT display unit is connected to a display port for reading the data memory. A logical address is employed by processor and display unit for any given memory section to identify the desired logical memory location starting from a logical zero reference. The data memory unit includes an offset register for each part. The appropriate offset register is updated with each data sample input to track the offset of the logical address zero reference from the physical zero reference of the part or section. Where the data memory is configured with a plurality of parts forming a section, one offset register may be assigned to the section or the individual registers may be employed. A logic means provided in the memory unit calculates the physical location for the logical address based on the offset number in the register and the size of the array.
申请公布号 US4093995(A) 申请公布日期 1978.06.06
申请号 US19760670890 申请日期 1976.03.26
申请人 NORLAND CORPORATION 发明人 SMITH, STEVEN R.;ROSE, FREDERICK A.
分类号 G01R13/34;G01R29/02;G06F1/18;G09G1/00;(IPC1-7):G06F3/14;G06F13/06;G06F3/05 主分类号 G01R13/34
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