发明名称 TEST DATA TOTALIZATION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a test data totalization system which can accurately catch symptom changes and improve the objectivity of data by totalizing specific view data as the same data. SOLUTION: The system is equipped with a supposition totalizing means 6 which regards a count P to 1st view A as a count Q to 2nd view and counts it when there are the count P to the 1st view A and the count Q to the 2nd view B and then when observers count the same view as different representations, the view different in representation is counted as the same view. Therefore, the same view is never handled as different data and delicate trends can surely be caught to eliminate the overlooking of symptom changes, thereby greatly improving the objectivity of data. The need to conduct an experiment again can be reduced and the cost needed for a test can be reduced.
申请公布号 JP2001118016(A) 申请公布日期 2001.04.27
申请号 JP19990295909 申请日期 1999.10.18
申请人 H & T:KK;HAMADA KOJI 发明人 HAMADA KOJI
分类号 G01N33/48;G01N33/15;G06F17/30;G06F19/00;G06Q50/22;G06Q50/24 主分类号 G01N33/48
代理机构 代理人
主权项
地址
您可能感兴趣的专利