发明名称 MEASURING INSTRUMENT AND MASK TEST METHOD
摘要 PROBLEM TO BE SOLVED: To quickly make the test of a multi-channel waveform for a telecom mask. SOLUTION: A taking-in circuit 210 takes in each waveform sample of M signals from a circuit to be tested, and a controller 230 generates mask pixel data defining the mask. The waveform samples and the mask pixel data are stored to a raster memory 250. A raster circuit 240 reads the storing place of the memory, the waveform sample is written at a storing position presently storing the mask pixel and it judges the occurrence of mask collision. The total of the M input signal waveforms and the mask are shown on display means 280, 290.
申请公布号 JP2001116770(A) 申请公布日期 2001.04.27
申请号 JP20000257806 申请日期 2000.08.28
申请人 TEKTRONIX INC 发明人 LETTS PETER J;STEVEN C HARRING
分类号 G01R13/20;G01R13/30;G01R13/34;G01R31/28;H04B17/00;H04L1/24;H04M3/00;H04M3/30;(IPC1-7):G01R13/20 主分类号 G01R13/20
代理机构 代理人
主权项
地址