发明名称 METHOD FOR SUPPLYING TREATING LIQUID
摘要 PROBLEM TO BE SOLVED: To provide a method for supplying treating liquid by which the used amount of a treating liquid can be reduced and, in addition, can reduce the amount of the treating liquid left on the surface of an object to be treated. SOLUTION: A method for supplying treating liquid includes a step of supplying a polymer removing liquid to the whole surface of a wafer W while the wafer W is made to stand still, a step of leaving the wafer W in the standing still state for 2-10 seconds, and a step of flinging away the polymer removing liquid and removed polymer from the wafer W by rotating the wafer W. The method also includes a step of stopping the rotating wafer W and holding the wafer W in the stopping state for 2-5 seconds, a step of supplying the polymer removing liquid to the whole surface of the wafer W while the wafer W is rotated, and a step of stopping the rotating wafer W and leaving the wafer W in the stopping state for 2-10 seconds. In addition, the method also includes a step of flinging the polymer removing liquid and removed polymer from the wafer W by rotating the wafer W.
申请公布号 JP2001118828(A) 申请公布日期 2001.04.27
申请号 JP19990295552 申请日期 1999.10.18
申请人 SEIKO EPSON CORP 发明人 TANAKA NOBUYUKI
分类号 H01L21/302;B01J4/00;C23F1/08;G03F7/30;H01L21/027;H01L21/306;H01L21/3065;H01L21/308;(IPC1-7):H01L21/306 主分类号 H01L21/302
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