发明名称 SURFACE PURIFICATION METHOD, SURFACE SMOOTHNESS IMPROVEMENT METHOD, AND PURIFICATION DEVICE OF COMPOUND SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method for purifying the surface of a compound semiconductor substrate that has been improved to eliminate C in addition to an oxide on the surface. SOLUTION: A compound semiconductor substrate 1 is carried into a treatment chamber 1. Gas containing a halogen atom is brought into contact with the surface of the compound semiconductor substrate 1. The compound semiconductor substrate 1 is heated.
申请公布号 JP2001118819(A) 申请公布日期 2001.04.27
申请号 JP19990299438 申请日期 1999.10.21
申请人 SUMITOMO ELECTRIC IND LTD 发明人 MATSUOKA TORU;NAKAMURA TAKAO
分类号 B08B5/00;H01L21/304;(IPC1-7):H01L21/304 主分类号 B08B5/00
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