发明名称 |
SURFACE PURIFICATION METHOD, SURFACE SMOOTHNESS IMPROVEMENT METHOD, AND PURIFICATION DEVICE OF COMPOUND SEMICONDUCTOR SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for purifying the surface of a compound semiconductor substrate that has been improved to eliminate C in addition to an oxide on the surface. SOLUTION: A compound semiconductor substrate 1 is carried into a treatment chamber 1. Gas containing a halogen atom is brought into contact with the surface of the compound semiconductor substrate 1. The compound semiconductor substrate 1 is heated.
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申请公布号 |
JP2001118819(A) |
申请公布日期 |
2001.04.27 |
申请号 |
JP19990299438 |
申请日期 |
1999.10.21 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
MATSUOKA TORU;NAKAMURA TAKAO |
分类号 |
B08B5/00;H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
B08B5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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