发明名称 TRANSMISSION ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To obtain a transmission electron microscope which measures and indicates an amount and directions deviations in a visual field of a reference image recorded after an arbitrary set time relative to a recorded image in a real time and a high degree of accuracy and automatically corrects for the deviations in visual field. SOLUTION: A transmission electron microscope comprises a means for calculating an deviation amount in visual field among a plurality of sample permeation images, a means for changing an electric current given in a deflector for deflecting an electron beam or moving a sample to automatically correct the deviations in visual field, and a control means for repeating this operation means to decrease the deviations in the visual field.
申请公布号 JP2001118535(A) 申请公布日期 2001.04.27
申请号 JP19990296245 申请日期 1999.10.19
申请人 HITACHI LTD 发明人 INADA HIROMI;OTSUKA HISASHI;NAGAOKI ISAO;KOBAYASHI HIROYUKI
分类号 H01J37/22;G06T1/00;H01J37/147;(IPC1-7):H01J37/147 主分类号 H01J37/22
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