发明名称 |
TRANSMISSION ELECTRON MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To obtain a transmission electron microscope which measures and indicates an amount and directions deviations in a visual field of a reference image recorded after an arbitrary set time relative to a recorded image in a real time and a high degree of accuracy and automatically corrects for the deviations in visual field. SOLUTION: A transmission electron microscope comprises a means for calculating an deviation amount in visual field among a plurality of sample permeation images, a means for changing an electric current given in a deflector for deflecting an electron beam or moving a sample to automatically correct the deviations in visual field, and a control means for repeating this operation means to decrease the deviations in the visual field.
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申请公布号 |
JP2001118535(A) |
申请公布日期 |
2001.04.27 |
申请号 |
JP19990296245 |
申请日期 |
1999.10.19 |
申请人 |
HITACHI LTD |
发明人 |
INADA HIROMI;OTSUKA HISASHI;NAGAOKI ISAO;KOBAYASHI HIROYUKI |
分类号 |
H01J37/22;G06T1/00;H01J37/147;(IPC1-7):H01J37/147 |
主分类号 |
H01J37/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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