发明名称 |
TEST SOCKET AND CONNECTION SHEET FOR USE IN TEST SOCKET |
摘要 |
PROBLEM TO BE SOLVED: To provide a test socket for semiconductor device having excellent maintainability in which good electrical contact with a probe is ensured regardless of variation in the height of external connection terminals and a test can be carried out continuously even if solder chips of the external connection terminals are deposited through repeated use. SOLUTION: The test socket for semiconductor device is provided with a connection sheet 2 comprising an elastically deformable insulating member and electrodes 202 and connecting a test probe 1 electrically with external connection terminals 14a in order to ensure good electrical contact through flexibility. The connection sheet 2 is replaceable and it is replaced with a new one when the contact resistance is increased due to deposition of solder chips in order to recover the contact performance.
|
申请公布号 |
JP2001116795(A) |
申请公布日期 |
2001.04.27 |
申请号 |
JP19990294677 |
申请日期 |
1999.10.18 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
MAEKAWA SHIGEKI;KASHIBA YOSHIHIRO |
分类号 |
G01R31/26;G01R1/04;G01R31/02;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|