| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor test system which generates automatically a conversion code between plural addresses, a test method, and a recording medium. SOLUTION: This system is an address conversion information generating system converting mutually addresses of plural kinds dealt by a test system testing a memory to be tested, and is provided with a conversion code automatic generating means generating conversion information of a reverse direction from the other side of an address to the one side of an address from a conversion code prescribing conversion relation of one direction from one side of an address to the other side of address for two kinds of addresses.
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