ANALOG BOUNDARY SCANNER, ANALOG BOUNDARY SCANNING CIRCUIT, BOUNDARY TEST DEVICE, INTEGRATED CIRCUIT DEVICE, SOCKET, AND CONNECTOR

摘要

PROBLEM TO BE SOLVED: To clarify connection pass/fail determination in a semi-connected state in regard to a soldering test by changing a slice level in an output signal which is a digital signal of 0 and 1 for determining the 0 and 1. SOLUTION: An output signal inputting part with an analog boundary scanning circuit is provided constituting a digital to a D/A converter, a comparator, and a comparing circuit for enabling varying a determination value level by shifting the slice level in the output signal outputted by an output terminal for diagnosis in accordance with an input signal having an expected value inputted from an input terminal for diagnosis. The output signal is determined in an analog state for determining whether connection is good or bad.