发明名称 |
TUNNEL CHANNEL TRANSISTOR AND METHOD OF DRIVING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a non-volatile memory which can reflect one of two logical states on the channel current of a tunnel channel transistor and can arbitrarily rewrite the state into any one of the logical states. SOLUTION: By utilizing the fact that a depletion layer formed in a source region 3 to be overlapped with a ferrorelectric layer 6 depends on the polarization state of ferroelectric, when a positive bias is applied to a drain region 4 with respect to the source region 3 to inject electrons from the source region 3 into the drain region 4 via an insulator 5, reading of data depending on the number of electrons emitted from the source region 3 is reflected by the polarization state of the ferroelectric layer 6 under a gate electrode 7. Since the polarization state of the layer 6 is spontaneous, the polarization state can be held (stored) and discriminated (read out) by the channel current of the transistor. |
申请公布号 |
JP2001118942(A) |
申请公布日期 |
2001.04.27 |
申请号 |
JP19990299679 |
申请日期 |
1999.10.21 |
申请人 |
MATSUSHITA ELECTRONICS INDUSTRY CORP |
发明人 |
SHIMADA YASUHIRO;HAYASHI SHINICHIRO;UCHIYAMA KIYOSHI;TANAKA KEISUKE |
分类号 |
H01L21/8247;H01L21/28;H01L21/336;H01L27/115;H01L29/772;H01L29/78;H01L29/788;H01L29/792;H01L29/88;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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