| 摘要 |
PROBLEM TO BE SOLVED: To provide a digital circuit capable of testing a particular digital circuit module in a short time with a simple and small scale structure. SOLUTION: Test data for a circuit module 24 inputted from a TIN terminal during testing operation sequentially shifts scan cells from 31,1 to 31,4, 32,1 to 32,4, 33,1 to 33,4, and to 34,1 to 34,4. And it is outputted from Q terminals of the scan cells 34,1 to 34,4 to the digital circuit module 24 and the digital circuit module operates on the basis of the test data. And it is judged whether or not the digital circuit module 24 is operating normally by monitoring external output terminals OUT1 to OUT4. |
