发明名称 Protection circuit and method for protecting a semiconductor device
摘要 An electrostatic discharge (ESD) protection circuit (20) includes an active load circuit (22) connected to a Laterally Diffused Metal Oxide Semiconductor (LDMOS) transistor (21) having a Lightly Doped Drain (LDD). The active load circuit includes a current limiting circuit (26) and a load transistor (27). The ESD protection circuit (20) operates to protect a power transistor (16) from damage due to an electrostatic charge. During an ESD event, the LDMOS transistor (21) enters avalanche breakdown after the voltage of the electrostatic charge exceeds the breakdown voltage of the LDMOS transistor (21). The ESD protection circuit (20) provides a low resistance path during an ESD event to dissipate the electrostatic charge.
申请公布号 US6222236(B1) 申请公布日期 2001.04.24
申请号 US19990302537 申请日期 1999.04.30
申请人 MOTOROLA, INC. 发明人 LAMEY DANIEL J.
分类号 H01L27/04;H01L21/822;H01L21/8234;H01L27/02;H01L27/06;H01L27/088;H01L29/78;H03K17/08;(IPC1-7):H01L23/62 主分类号 H01L27/04
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