发明名称 Wafer drying device and method
摘要 Nitrogen gas is jetted into a space on the liquid level of pure water in a drying chamber in which wafers are immersed. Simultaneously therewith, liquid-phase isopropyl alcohol is jetted at a temperature higher than the temperature of the wafers and in the vicinity of jetting openings for the nitrogen gas. When the wafers are exposed above the liquid level in the drying chamber, the pure water held on both front and rear surfaces of the wafers is replaced by the isopropyl alcohol of mist-form. The isopropyl alcohol is then evaporated, whereby the wafers are dried.
申请公布号 US6219936(B1) 申请公布日期 2001.04.24
申请号 US19990447219 申请日期 1999.11.23
申请人 TOHO KASEI CO., LTD. 发明人 KEDO YUTAKA;TAKEMURA YOSHIO;MATSUDA SUSUMU
分类号 H01L21/00;(IPC1-7):F26B7/00 主分类号 H01L21/00
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