| 摘要 |
Interferometric residual-stress analysis measures residual stress using a phase-shifting electronic speckle pattern interferometer and a coherent light source. By using a single frequency laser, the need for path length matching of earlier configurations is eliminated and allows the use of fiber optics to make the system more compact. Furthermore, phase-shifting of the laser allows quantitative interferometric analysis to be used to determine displacement. In addition, a computer-implemented residual stress analysis sub-system having a display provides residual stress information to a user. |
