发明名称 An apparatus for in-cassette monitoring of semiconductor wafers
摘要 A processing apparatus is presented for applying to a substantially flat workpiece contained in a cassette, and a processing tool coupled to the housing. The processing tool is displaceable along three mutually perpendicular axes relative to the cassette for inserting the tool into the gap and moving the tool inside the gap relative to the workpiece. The processing apparatus can be utilized in chemical mechanical polishing arrangement, photolithography arrangement, and CVD arrangement.
申请公布号 AU7683100(A) 申请公布日期 2001.04.23
申请号 AU20000076831 申请日期 2000.10.06
申请人 NOVA MEASURING INSTRUMENTS LTD. 发明人 MOSHE FINAROV;RANI KIPPER
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
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