| 摘要 |
<p>PROBLEM TO BE SOLVED: To establish a method for properly evaluating a window layer for compound semiconductor solar cells, to accurately control the quality of the window layer, and to inexpensively manufacture the solar cell with excellent performance and high quality with an appropriate yield. SOLUTION: According to a refractive index in the specific incidence light wavelength region of the window layer obtained by the spectrum of the refractive index to the incidence light wavelength of the window layer consisting of a compound semiconductor film and a transparent conductive film, the qualification of the window layer is evaluated. As the measurement/analysis method of the spectrum, the elliptic polarization analysis method is preferable. When the window layer of a solar cell where a photoelectric conversion layer is made of a CdTe film is to be evaluated in the incidence light wavelength range from the absorption end wavelength of the window layer to 1000 nm, the window layer with a refractive index of 2.45 to 2.90 is evaluated as an excellent one.</p> |
