| 摘要 |
PROBLEM TO BE SOLVED: To easily and inexpensively realize the correction of registration deviation. SOLUTION: A K(black) test pattern is obtained by arranging a plurality of lines in parallel, and a C(cyan) test pattern is obtained by arranging a plurality of patterns in a step state obtained by providing level differences in a direction orthogonally crossing with a K line in a direction in parallel with the K line. In the case of registration correction, in a present set condition (condition where it is assumed that registration deviation does not exist), the C test pattern and the K test pattern are plotted so that a central short line forming the C pattern in each step state is superposed on the corresponding K line, and a test image 50A is formed on the paper. A user can grasp correction amount by visually confirming a line where the C test pattern is superposed on the K test pattern and C color disappears on the image 50A. |
