METHOD AND CIRCUIT FOR TESTING RAM

摘要

PROBLEM TO BE SOLVED: To shorten test time by decreasing machine cycles for testing a RAM built in a DSP. SOLUTION: Data required for the test are prepared inside a DSP 11. Basic data are stored in a constant ROM(CROM) 20. Then, bit shift is applied by utilizing the data shift function of an ALU 18 while circulating these data and data to be written in a RAM 16 are successively generated.