发明名称 METHOD AND APPARATUS FOR MEASURING END FACE OF PIN HAVING MICRODIAMETER
摘要 PROBLEM TO BE SOLVED: To measure the perpendicularity at the end of a pin having a microdiameter being used as a gauge pin quickly, accurately and inexpensively. SOLUTION: The end face P2 of a columnar pin P is abutted against a stopper 30 while applying a rotational force to the circumferential side face P1 thereof and displacement of the end face P2 of the turning pin P from the center is measured by means of a displacement sensor L. Perpendicularity of the end face P2 of the pin P is then measured based on the displacement. The measuring apparatus comprises a base 10 for supporting the circumferential side face P1 of the columnar pin P, a rotary belt 20 for imparting a rotational force to the pin P by coming into pressure contact with an upper part of the circumferential side face P1 of the pin P supported horizontally on the supporting base 10, a stopper 30 abutting against the end face P2 of the turning pin P, and a sensor L for measuring the displacement of the end face P2 of the turning pin P from the center.
申请公布号 JP2001108425(A) 申请公布日期 2001.04.20
申请号 JP19990285338 申请日期 1999.10.06
申请人 TNK SANWA PRECISION CO LTD 发明人 MARUYAMA YUTAKA
分类号 G01B11/30;G01B21/30;(IPC1-7):G01B11/30 主分类号 G01B11/30
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