发明名称 POSITIVE TYPE PHOTORESIST COMPOSITION
摘要 PROBLEM TO BE SOLVED: To obtain a positive type photoresist composition excellent in coating properties, capable of forming a uniform photoresist film and useful particularly in the production of LCDs and LSIs because the occurrence of marks of dropping and radial unevenness (striation) is prevented. SOLUTION: A surfactant containing a specified nonionic surfactant and a fluorine-containing surfactant is incorporated into a basic composition comprising an alkali-soluble novolak type resin and a quinonediazido-containing compound to obtain the objective positive type photoresist composition.
申请公布号 JP2001109144(A) 申请公布日期 2001.04.20
申请号 JP19990285226 申请日期 1999.10.06
申请人 SHIPLEY FAR EAST LTD 发明人 TAKAHASHI KENTA;IKEDA FUMIHIKO;KAMATA YOSHITAKA;AWAJI AKIRA
分类号 H01L21/027;G03F7/004;G03F7/022 主分类号 H01L21/027
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