发明名称 |
POSITIVE TYPE PHOTORESIST COMPOSITION |
摘要 |
PROBLEM TO BE SOLVED: To obtain a positive type photoresist composition excellent in coating properties, capable of forming a uniform photoresist film and useful particularly in the production of LCDs and LSIs because the occurrence of marks of dropping and radial unevenness (striation) is prevented. SOLUTION: A surfactant containing a specified nonionic surfactant and a fluorine-containing surfactant is incorporated into a basic composition comprising an alkali-soluble novolak type resin and a quinonediazido-containing compound to obtain the objective positive type photoresist composition. |
申请公布号 |
JP2001109144(A) |
申请公布日期 |
2001.04.20 |
申请号 |
JP19990285226 |
申请日期 |
1999.10.06 |
申请人 |
SHIPLEY FAR EAST LTD |
发明人 |
TAKAHASHI KENTA;IKEDA FUMIHIKO;KAMATA YOSHITAKA;AWAJI AKIRA |
分类号 |
H01L21/027;G03F7/004;G03F7/022 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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