发明名称 CERAMIC SUBSTRATE FOR SEMICONDUCTOR MANUFACTURING/ INSPECTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To obtain a ceramic substrate which has superior temperature controllability, temperature rising/dropping characteristic, or vacuum-chucking characteristic and can be connected highly reliably to external terminals. SOLUTION: A ceramic substrate is constituted in such a way that conductors like platy heating elements composed of a conductive ceramic are buried in the substrate and, at the same time, connection pads for connecting external terminals are provided on one surface of the conductor. In addition, the connection pads are formed of a metal, such as tungsten, molybdenum, platinum, etc., having a high melting point.</p>
申请公布号 JP2001110878(A) 申请公布日期 2001.04.20
申请号 JP20000174566 申请日期 2000.06.09
申请人 IBIDEN CO LTD 发明人 ITO YASUTAKA;FURUKAWA MASAKAZU;HIRAMATSU YASUJI
分类号 H05B3/20;H01L21/027;H01L21/66;H01L21/68;H01L21/683;H05B3/02;H05B3/14;H05B3/18;(IPC1-7):H01L21/68 主分类号 H05B3/20
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