发明名称 |
SEMICONDUCTOR DEVICE OF SOI STRUCTURE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide semiconductor devices which are of SOI structure and can be highly integrated by decreasing a distance between diodes without deteriorating them in insulation characteristics, and to provide a method of manufacturing the same. SOLUTION: A first diffusion region 128 which forms a P+/N diode and a second diffusion region 130 which forms an N+/P diode are insulated by an STI 112a at a semiconductor substrate 100a.
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申请公布号 |
JP2001110911(A) |
申请公布日期 |
2001.04.20 |
申请号 |
JP20000050534 |
申请日期 |
2000.02.22 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
KO EIKEN;KIN HEIZEN |
分类号 |
H01L27/08;H01L21/20;H01L21/762;H01L21/8234;H01L21/84;H01L27/00;H01L27/06;H01L27/12;(IPC1-7):H01L21/823 |
主分类号 |
H01L27/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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