发明名称 METHOD FOR INSPECTING OPTICAL TRANSPARENT FILM
摘要 PROBLEM TO BE SOLVED: To correctly inspect defects such as a foreign matter adhering to an optical transparent film face opposite to a release film, etc., and defects such as flaws, pinholes, irregularities, etc., of the optical transparent film face and facilitate the inspection by a transmission light. SOLUTION: According to the inspection method for optical transparent films, an illumination light is shed onto an optical transparent film 1 having a release film 9 stacked from the opposite side to the release film 9, and an optical transparent film face F2 of the opposite side is observed. At this time, the illumination light is shed onto the optical transparent film 1 to observe the optical transparent film face in a state while the light is prevented from hitting an outer face of the release film 9 from the outside of the outer face, and also the illumination light and the release film 9 are set to separate colors complementary to each other.
申请公布号 JP2001108630(A) 申请公布日期 2001.04.20
申请号 JP19990290116 申请日期 1999.10.12
申请人 SUMITOMO CHEM CO LTD 发明人 KOBAYASHI SHINJI
分类号 G01B11/30;G01N21/89;G01N21/892;(IPC1-7):G01N21/892 主分类号 G01B11/30
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