| 摘要 |
PROBLEM TO BE SOLVED: To provide a memory test device which displays a test state display picture of an incorporated memory of DUT and a program advance display picture on the same screen. SOLUTION: This device is provided with a storing section storing test data written in an incorporated memory, an address with which this data is written, and a test pattern program generating sequentially expected value data to be outputted from an incorporated memory as a result of writing the test data in the incorporated memory and detecting abnormality of an incorporated memory by comparing an output of an incorporated memory with expected value data, a test section performing a test pattern program, a bit map whole display means displaying a bit map image of a whole incorporated memory informally, a test state display means displaying a result of a test performed by the test section, a program advance display means displaying an execution state of a test pattern program, and a test screen display means displaying the bit map whole display means, the test state display means, and the program advance display means on the same screen.
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