发明名称 SURFACE FORCE-MEASURING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a surface force-measuring device and method for accurately measuring the surface force between samples even in the case of the samples where light cannot be transmitted and for automating the measurement of surface force operating between the sample surfaces. SOLUTION: A second sample-retaining body with a surface opposite to the surface of a first sample-retaining body and at the same time, a reflection surface at the opposite side of the surface is mounted to an elastic member that can be deflected for the traveling direction of the first sample-retaining body being supported so that it can slightly travel in a specific direction in a chamber and is made of a specific spring constant. An interference light- detecting device is provided outside the chamber, where the device applies diffraction light so that it converges on the reflection surface of the second sample-retaining body and measures the amount of deflection of the elastic member based on the light intensity of interference light where diffraction light from the reflection surface is connected. Surface force operating between the sample surfaces is measured according to the amount of deflection and spring constant of the elastic member being detected by the interference light- detecting device.
申请公布号 JP2001108603(A) 申请公布日期 2001.04.20
申请号 JP19990291938 申请日期 1999.10.14
申请人 NIPPON LASER & ELECTRONICS LAB;JAPAN SCIENCE & TECHNOLOGY CORP 发明人 KURIHARA KAZUE;TAJIMA HARUO
分类号 G01L5/00;G01B11/00;G01B21/00;G01Q20/02;G01Q30/20;G01Q60/24;G01Q60/28;(IPC1-7):G01N13/16 主分类号 G01L5/00
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