发明名称 |
METHOD OF OPTIMIZING WAVELENGTH CALIBRATION |
摘要 |
The present invention provides a method of calibrating the wavelength of a target instrument, based on a calibration model developed for a primary instrument. The method comprises: (a) obtaining a reference set of at least two wavelength calibration parameters for the primary instrument; (b) obtaining a target set of at least two corresponding wavelength calibration parameters for the target instrument; (c) measuring a reference spectral response of a sample with the primary instrument; (d) measuring a target spectral response of the sample with the target instrument; (e) iteratively adjusting the target set of wavelength calibration parameters; (f) for each target set of wavelength calibration parameters, determining spectral residuals corresponding to that target set; and (g) selecting an optimum set of wavelength calibration parameters based on the spectral residuals for each target set of wavelength calibration parameters.
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申请公布号 |
WO0127572(A1) |
申请公布日期 |
2001.04.19 |
申请号 |
WO2000CA01182 |
申请日期 |
2000.10.13 |
申请人 |
CME TELEMETRIX INC.;CADELL, THEODORE, E.;LU, GENG |
发明人 |
CADELL, THEODORE, E.;LU, GENG |
分类号 |
G01J3/02;G01J3/28;(IPC1-7):G01J3/28 |
主分类号 |
G01J3/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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