发明名称 Lithographic projection apparatus
摘要 A lithographic projection apparatus comprising: an illumination system LA, EX, IN, CO for supplying a projection beam of radiation PB; a first object table MT for holding a mask MA; a second object table WT provided with a support surface for supporting and holding a substrate W at its backside surface; and, a projection system PL for imaging an irradiated portion of the mask MA onto a target portion of the substrate W, characterized in that the apparatus comprises contamination detection means constructed and arranged to detect the presence of contamination on one or both of the support surface and the substrate backside surface. <IMAGE>
申请公布号 EP1093022(A2) 申请公布日期 2001.04.18
申请号 EP20000308904 申请日期 2000.10.10
申请人 ASML NETHERLANDS B.V. 发明人 VAN DE PASCH, ENGELBERTUS ANTONIUS FRANSISCUS;VAN MEER, ASCHWIN LODEWIJK HENDRICUS JOHANNES;KLAASSEN, FRANCISCUS ADRIANUS GERARDUS
分类号 G03F7/20;(IPC1-7):G03F7/20;G01N21/94 主分类号 G03F7/20
代理机构 代理人
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