发明名称 Apparatus and method for polishing workpiece
摘要 <p>A polishing apparatus is used for polishing a workpiece such as a semiconductor wafer to a flat mirror finish. The polishing apparatus comprises a turntable having a polishing surface (21), a top ring for holding a workpiece and pressing the workpiece against the polishing surface (21), a holding surface (3) of the top ring (2) for holding the workpiece, and a retainer ring (7) for retaining the workpiece within the holding surface of the top ring (2). The holding surface (3) is deformable by fluid having variable pressure, and the retainer ring (7) presses the polishing surface (21) under a variable pressing force.</p>
申请公布号 EP1092504(A1) 申请公布日期 2001.04.18
申请号 EP20000118180 申请日期 2000.08.30
申请人 EBARA CORPORATION 发明人 KATSUOKA, SEIJI;YASUDA, HOZUMI;SONE, TADAKAZU;KOJIMA, SHUNICHIRO;TSUJIMURA, MANABU
分类号 H01L21/304;B24B37/30;B24B37/32;(IPC1-7):B24B37/04;B24B41/06 主分类号 H01L21/304
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