| 摘要 |
A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector used in a digital x-ray system (10). The technique employs test circuits (122, 124, 126) associated with each row driver (46) of the detector. The test circuits are enabled by a test enable signal (150), and the row driver sequentially enables the rows of the detector, along with the individual test circuits. In a test sequence, output signals from the two test circuits are monitored to identify whether a defect, such as a short circuit, is likely to exist in the row or row driver. The test circuitry adds only minimal area and complexity to the row driver function, providing a high degree of test coverage at a low cost, with minimal likelihood of test circuitry-induced failures. <IMAGE> |
