Method for contact anneal in a doped dielectric layer without dopant diffusion problem

摘要

A method for annealing a contact in a doped dielectric layer without the occurrence of dopant diffusion problem by depositing a sacrificial barrier layer of oxide material in the contact opening which is capable of preventing diffusion of dopant ions into the contact opening during a high temperature reflow process for the doped dielectric layer and followed by a deposition of an electrically conductive metal into the contact opening.