发明名称 Method for filling a via opening or contact opening in an integrated circuit
摘要 An integrated circuit includes a substrate (12) having a conductive region (18), and includes a dielectric layer (19) disposed over the substrate. An upwardly tapering frustoconical opening (22) is created through the dielectric layer to the conductive region. A barrier layer (31) is then applied, after which a thin metal layer (32) is applied, the upper end of the opening being pinched off or closed by the metal layer. Heat and pressure are then simultaneously applied, so that the metal layer flows to completely fill the available space within the opening. Selected portions of the metal layer external to the opening are then etched away. A further dielectric layer (41) is applied over the barrier layer and metal layer, and then planarization is carried out on the further dielectric layer.
申请公布号 US6218277(B1) 申请公布日期 2001.04.17
申请号 US19990236799 申请日期 1999.01.25
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 HAMAMOTO KAZUHIRO
分类号 H01L21/3213;H01L21/768;(IPC1-7):H01L21/44;H01L21/476 主分类号 H01L21/3213
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