发明名称 |
Infrared imaging of ultrasonically excited subsurface defects in materials |
摘要 |
A thermal imaging system for detecting cracks and defects in a component. An ultrasonic transducer is coupled to the specimen through a malleable coupler. Ultrasonic energy from the transducer causes the defects to heat up, which is detected by a thermal camera. The ultrasonic energy is in the form of a pulse where the frequency of the ultrasonic signal is substantially constant within the pulse. A control unit is employed to provide timing and control for the operation of the ultrasonic transducer and the camera. |
申请公布号 |
AU7492000(A) |
申请公布日期 |
2001.04.17 |
申请号 |
AU20000074920 |
申请日期 |
2000.09.15 |
申请人 |
WAYNE STATE UNIVERSITY |
发明人 |
ROBERT L. THOMAS;LAWRENCE D. FAVRO;XIAOYAN HAN;ZHONG OUYANG;HUA SUI;GANG SUN |
分类号 |
G01N25/72;G01N29/04;G01N29/22;G01N29/24;G01N29/28;G01N29/34;G01N29/46 |
主分类号 |
G01N25/72 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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